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146.583  Articles
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Wafer yield is a key indicator to pursuing excellence in semiconductor manufacturing. With the increased wafer size, the enhanced complexity and precision of wafer fabrication is possible. Using monitoring to improve the process by predicting the yield ha... see more

Wafer yield is a key indicator to pursuing excellence in semiconductor manufacturing. With the increased wafer size, the enhanced complexity and precision of wafer fabrication is possible. Using monitoring to improve the process by predicting the yield ha... see more

The ICsIMMICs attained importance in the field of microelectronics as these play a majorrole in the aerospace industry. The reliability of the ICsIMMICs becomes the critical issue becauseof complex material properties. A methodology has to be adopted whic... see more

The purpose of this study is to test the X-ray equipment GE Type XR 6000 in in JTRR Laboratory of Health Polytechnic in Semarang the and analyze the test results. It is a quantitative measurement of some components including Collimator, X-ray tube and gen... see more

An acceptance sampling plan problem based on truncated life tests when the lifetime following a Sushila distribution is considered in this paper. For various acceptance numbers, confidence levels and values of the ratio between fixed experiment time and p... see more

The paper presents method of carrying out and scope of tests preceding acceptance of railway traffic control equipment for application in Polish State Railway (PKP). Terms of commissioning of equipment manufactured for railways are imposed by internationa... see more

Aim: This study aimed to investigate the effect of acceptance and commitment therapy on test anxiety and psychological well-being.Methods: This study was an experimental with a pre-test and post-test design and control group. Participants were consisted o... see more

In this paper, acceptance sampling plans are developed when the life test is truncated at a pre-assigned time. For different acceptance numbers, confidence levels and values of the ratio of the fixed experiment time to the specified average life time, the... see more

Nowadays, more and more MMICs (Microwave Monolithic Integrated Circuit), such as limiters and switches, are designed to have balanced and unbalanced test pad structures to solve the challenging size restrictions and integration requirements for MMICs. Hyb... see more

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