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388  Articles
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In this study, the proposed bandpass filter (BPF) connects an interdigital and a spiral capacitor in series between the two symmetrical halves of a circular intertwined spiral inductor. For the mass production of devices and to achieve a higher accuracy a... see more

Arduino UNO R3 is one of the cheapest and easiest microcontroller boards that has great potential to be used as a basis for the measurement system. This study aims to develop measurement system of crude oil capacitance by using IDCs(Interdigital Capacitor... see more

To increase the speed of information flow and storage capacity in electronic devices laser can be used to carry information instead of electric current. Since the photon is faster than electrons, one expects information to be transmitted very fast through... see more

In the study, it was aimed to reveal the morphological, morphometric and histological characteristics of sinus interdigitalis found in the fore and hind feet of Konya merino sheep. For this purpose, the fore and hind feet of 10 Konya merino sheep, weighin... see more

We present an automated evaluation procedure to characterize MOS capacitors involving high-k gate dielectrics. Suitability of LabVIEW environment for online web-based semiconductor device characterization is demonstrated. Developed algorithms have been su... see more

Electrical and Electronic equipments are designed to operate on specified voltage and frequency. This objective may not be realized when there is supply-demand power imbalance, with heavy power loss on the distribution system being one of the identified m... see more

This paper work is concerned with the power factor correction using static capacitor being a case study of Nigerian 330kV Grid System. The research involves collection of various data relevant to the study from National Control Centre (NCC), Osogbo. The a... see more

The subject of the study is oxide-semiconductor capacitors, which are widely used in the manufacture of electronic equipment. The goal of the study is to determine the main causes of failures of oxide-semiconductor capacitors at the production and operati... see more

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