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175.042  Articles
1 of 17.505 pages  |  10  records  |  more records»
The advent of ultrafast X-ray free-electron lasers (XFELs) opens the tantalizing possibility of the atomic-resolution imaging of reproducible objects such as viruses, nanoparticles, single molecules, clusters, and perhaps biological cells, achieving a res... see more

High power attosecond (as) X-ray pulses are in great demand for ultrafast dynamics and high resolution microscopy. We numerically demonstrate the generation of a ~230 attosecond, 1.5 terawatt (TW) pulse at a photon energy of 1 keV, and a 115 attosecond, 1... see more

X-ray free electron lasers (XFELs) providing ultrashort intense pulses of X-rays have proven to be excellent tools to investigate the dynamics of radiation-induced dissociation and charge redistribution in molecules and nanoparticles. Coincidence techniqu... see more

The development of X-ray free-electron lasers (XFELs) has launched a new era in X-ray science by providing ultrafast coherent X-ray pulses with a peak brightness that is approximately one billion times higher than previous X-ray sources. The Linac Coheren... see more

Molecular dynamics is of fundamental interest in natural science research. The capability of investigating molecular dynamics is one of the various motivations for ultrafast optics. We present our investigation of photoionization and nuclear dynamics in m... see more

This meeting report describes the Nobel Symposium on Free Electron Laser Research, which was organized in Sigtuna, Sweden, 14–18 June 2015.

In the present study, Sn70-X at.% -Bi15 at.% -Sb15 at.%- Inx at.% alloy ( x= 0, 2, 4, 6), were prepared by melt spinning technique. Optical microscopy, scanning electron microscopy combined with energy dispersive X-ray analysis (SEM-EDX), X-ray diffractio... see more

Sn70-X at.% -Bi15 at.% -Sb15 at.%- Inx at.%  alloy ribbons were produced using melt-spinning technique. The surfaces were characterized with Optical Microscopy. Also, scanning electron microscopy combined with energy dispersive X-ray analysis (SEM-ED... see more

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