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ISSN:    frecuency : 4   format : Electrónica

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Volume 5 Number 1 Year 1991

3 articles in this issue 

Schalk J. Claasen

ENGLISH ABSTRACT: AMIR and SPAR are Monte Carlo based computer software for the reliability, availability and logistic support analysis of complex systems. They provide the infrastructure for the effective analysis of such systems,... see more

 

C.J. Smith,K. Adendorff

ENGLISH ABSTRACT: An automated visual inspection system is not the panacea that it is made out to be. There are many pitfall s for the unwary company wi sh i ng to implement such an . inspection system. The major advantages and ... see more