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ESPAÑOL
Journal title
Journal of Intelligence
ISSN:
2079-3200
frecuency
:
4
format
:
Electrónica
Technology
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Volume
3
Number
2 Pages41-58
Part
June
Year
2015
2 articles in this issue
The C-Test: An Integrative Measure of Crystallized Intelligence
Purya Baghaei and Mona Tabatabaee
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Zeroing in on the Genetics of Intelligence
Ruben C. Arslan and Lars Penke
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