SUMMARY
The paper proposes an efficient approach to detecting an increase in the fraction of nonconformingitems. The novelty of the paper is its utilization of the concept of the Bayesianrule and construction of a Bayesian control chart. This approach is significantly better thancertain existing effective approaches in detecting small deviations. The major applicationof the charts is in high-tech industries and short run processes where the detection of smalldeviations and the evaluation of the initial setup are very important. The simulated resultsfor the average run length profiles demonstrate the superiority of the new approach againstthe standard p chart, binomial EWMA and moving average approach. The new approach iseasy to understand and may be attractive and useful to researchers, while it can also be aneffective alternative for other existing approaches.